Minimization of CTS of k-CNOT Circuits for SSF and MSF Model

  • Authors:

  • Muhammad Ibrahim;Ahsan Raja Chowdhury;Hafiz Md. Hasan Babu

  • Affiliations:

  • -;-;-

  • Venue:
  • DFT '08 Proceedings of the 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
  • Year:
  • 2008

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Abstract

With the technology entering the nano dimension, manufacturing processes are less and less reliable, thus drastically impacting the yield. A possible solution to alleviate this problem in the future could consist in using fault tolerant architectures ...