Diagnosis of Analog Circuits by Using Multiple Transistors and Data Sampling

  • Authors:

  • Yukiya Miura;Jiro Kato

  • Affiliations:

  • -;-

  • Venue:
  • DFT '08 Proceedings of the 2008 IEEE International Symposium on Defect and Fault Tolerance of VLSI Systems
  • Year:
  • 2008

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Abstract

We have proposed a method for diagnosing analog circuits that is realized by combining the operation-region model and the X-Y zoning method. In this paper, we propose two improved methods for diagnosing analog circuits by using multiple transistors and data sampling. Diagnosis by multiple transistors gives results of diagnostic resolution that is higher than that by a single transistor. Diagnosis by multiple data sampling gives results of diagnostic sequence length and processing time that are shorter than that by a fixed data sampling. We demonstrate the effectiveness of the proposed methods by applying them to ITC’97 benchmark circuits with hard faults and soft faults. The proposed method can elevate diagnostic resolution by 6.4%, reduce diagnostic sequence length to 5.7%, and reduce processing time to 2.06%, in the maximum compared with our previous method.