Enhanced controllability for IDDQ test sets using partial scan

• Authors:

• Tapan J. Chakraborty;Sudipta Bhawmik;Robert Bencivenga;C. J. Lin

• Affiliations:

• AT&T Bell Labs, ERC, P.O. Box 900, Princeton, NJ;AT&T Bell Labs, ERC, P.O. Box 900, Princeton, NJ;AT&T Bell Labs, ERC, P.O. Box 900, Princeton, NJ;AT&T Bell Labs, ERC, P.O. Box 900, Princeton, NJ

• Venue:
• DAC '91 Proceedings of the 28th ACM/IEEE Design Automation Conference
• Year:
• 1991