Snuper computer: a computer in instrumentation automaton

  • Authors:

  • G. Estrin;D. Hopkins;B. Coggan;S. D. Crocker

  • Affiliations:

  • University of California Los Angeles, Los Angeles, California;University of California Los Angeles, Los Angeles, California;University of California Los Angeles, Los Angeles, California;University of California Los Angeles, Los Angeles, California

  • Venue:
  • AFIPS '67 (Spring) Proceedings of the April 18-20, 1967, spring joint computer conference
  • Year:
  • 1967

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Abstract

Classically the preponderance of measurements made on information processing systems is done for purposes of prediction or diagnosis of malfunction. The environment is monitored with observations of the ambient temperature, common system voltages and currents, and clocking pulse streams. Micromeasurements of system elements are made on-line with oscilloscope or meter and off-line by specialized more complex testing systems. Systems are used to test themselves by generation of diagnostic programs using predefined data sets and by explicit controls permitting degradation of the environment. As opposed to equipment malfunction, programs malfunction only in the sense that there is an inconsistency between the intent of the programmer and the finally executed machine code. Diagnostic programs aid in making measurements related to consistency.