Switch level hot-carrier reliability enhancement of VLSI circuits
DFT '95 Proceedings of the IEEE International Workshop on Defect and Fault Tolerance in VLSI Systems
A Transition Based BIST Approach for Passive Analog Circuits
ISQED '00 Proceedings of the 1st International Symposium on Quality of Electronic Design
EEPROM Diagnosis Based on Threshold Voltage Embedded Measurement
Journal of Electronic Testing: Theory and Applications
Transimpedance amplifiers using three cascade variable inverter gain stages
Analog Integrated Circuits and Signal Processing
Channel width tapering of serially connected MOSFET's with emphasis on power dissipation
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Wafer yield estimation using support vector machines
ISNN'06 Proceedings of the Third international conference on Advances in Neural Networks - Volume Part III
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