Hardware fault detection

Authors:
M. A. Breuer
Affiliations:
University of Southern California, Los Angeles, California
Venue:
AFIPS '68 (Fall, part II) Proceedings of the December 9-11, 1968, fall joint computer conference, part II
Year:
1968

Citing 2
Cited 0

Fault detection in a linear cascade of identical machines

SWAT '68 Proceedings of the 9th Annual Symposium on Switching and Automata Theory (swat 1968)
Fault detecting experiments for sequential circuits

SWCT '64 Proceedings of the 1964 Proceedings of the Fifth Annual Symposium on Switching Circuit Theory and Logical Design

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Abstract

One of the most pressing problems currently confronting the design automation specialist is that of the automatic generation of component failure detection and diagnostic test sequences. This problem is made more difficult due to the new LSI circuits where we may have hundreds of components on a chip with only a few accessible input/output terminals.