A model and implementation of a universal time delay simulator for large digital nets
AFIPS '70 (Spring) Proceedings of the May 5-7, 1970, spring joint computer conference
Acceptable Testing of VLSI Components Which Contain Error Correctors
IEEE Transactions on Computers
Installation management: the next ten years
AFIPS '72 (Spring) Proceedings of the May 16-18, 1972, spring joint computer conference
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This paper considers various coding techniques which could be applied to a memory organization to achieve detection and correction of failures. In this discussion, we define a fault as a malfunction of a systems component and a failure as a manifestation of a fault. Notice that a single fault can result in multiple failures. Thus, techniques such as error-detecting and correction codes, when used alone, are limited in that they operate on failures---not faults.