Texture Measures for Carpet Wear Assessment
IEEE Transactions on Pattern Analysis and Machine Intelligence
A Theory for Multiresolution Signal Decomposition: The Wavelet Representation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Maximum likelihood unsupervised textured image segmentation
CVGIP: Graphical Models and Image Processing
The nature of statistical learning theory
The nature of statistical learning theory
Graphical Models and Image Processing
Neural Networks: A Comprehensive Foundation
Neural Networks: A Comprehensive Foundation
Digital Image Processing
Support Vector Machines for Texture Classification
IEEE Transactions on Pattern Analysis and Machine Intelligence
Robust Defect Segmentation in Woven Fabrics
CVPR '98 Proceedings of the IEEE Computer Society Conference on Computer Vision and Pattern Recognition
Wavelet methods for texture defect detection
ICIP '97 Proceedings of the 1997 International Conference on Image Processing (ICIP '97) 3-Volume Set-Volume 3 - Volume 3
IEEE Transactions on Pattern Analysis and Machine Intelligence
Identifying and Locating Surface Defects in Wood: Part of an Automated Lumber Processing System
IEEE Transactions on Pattern Analysis and Machine Intelligence
Comparing support vector machines with Gaussian kernels to radialbasis function classifiers
IEEE Transactions on Signal Processing
Robust support vector machine with bullet hole image classification
IEEE Transactions on Systems, Man, and Cybernetics, Part C: Applications and Reviews
Texture analysis and classification with tree-structured wavelet transform
IEEE Transactions on Image Processing
Support vector machines for histogram-based image classification
IEEE Transactions on Neural Networks
A comparison of methods for multiclass support vector machines
IEEE Transactions on Neural Networks
Computers and Industrial Engineering
Expert Systems with Applications: An International Journal
Expert Systems with Applications: An International Journal
Computers and Industrial Engineering
Hi-index | 0.01 |
In this paper, we present a multi-resolution approach for the inspection local defects embedded in homogeneous copper clad laminate (CCL) surfaces. The proposed method does not rely on the extraction of local textural features in a spatial basis. It is based mainly on the wavelet transform and inverse wavelet transform on the smooth subimage and detail subimages by properly selecting the adequate decomposition levels. The restored image will remove regular, repetitive texture patterns and enhance only local anomalies. Based on these local anomalies, feature extraction methods can then be used to discriminate between the defective regions and homogeneous regions in the restored image. Real samples with five classes of defects have been classified using this novel multi-classifier, namely, support vector machine. The experimental results show the efficacy of the proposed method.