An efficient topological characterization of gray-levels textures, using a multiresolution representation

Defect detection in textured surfaces using color ring-projection correlation

Machine Vision and Applications

Automated visual inspection of ripple defects using wavelet characteristic based multivariate statistical approach

Image and Vision Computing

Tiny surface defect inspection of electronic passive components using discrete cosine transform decomposition and cumulative sum techniques

Image and Vision Computing

Modelling the spectrum of the fourier transform of the texture in the solar EIT images

Machine Graphics & Vision International Journal

Applying wavelets transform and support vector machine for copper clad laminate defects classification

Computers and Industrial Engineering