Machine Learning
Artificial Neural Networks: A Tutorial
Computer - Special issue: neural computing: companion issue to Spring 1996 IEEE Computational Science & Engineering
Optimal design of fuzzy sliding-mode control: a comparative study
Fuzzy Sets and Systems
Pairwise classification and support vector machines
Advances in kernel methods
Statistical Pattern Recognition: A Review
IEEE Transactions on Pattern Analysis and Machine Intelligence
Learning with Kernels: Support Vector Machines, Regularization, Optimization, and Beyond
Learning with Kernels: Support Vector Machines, Regularization, Optimization, and Beyond
A Tutorial on Support Vector Machines for Pattern Recognition
Data Mining and Knowledge Discovery
Text Categorization with Suport Vector Machines: Learning with Many Relevant Features
ECML '98 Proceedings of the 10th European Conference on Machine Learning
Asymptotic behaviors of support vector machines with Gaussian kernel
Neural Computation
IBM Journal of Research and Development
Support vector machine-based image classification for genetic syndrome diagnosis
Pattern Recognition Letters
A classification technique based on radial basis function neural networks
Advances in Engineering Software
An effective method to detect and categorize digitized traditional Chinese paintings
Pattern Recognition Letters
Neural network-based mean-variance-skewness model for portfolio selection
Computers and Operations Research
A comparison of methods for multiclass support vector machines
IEEE Transactions on Neural Networks
Hi-index | 12.05 |
Wafer yield is an important index of efficiency in integrated circuit (IC) production. The number and cluster intensity of wafer defects are two key determinants of wafer yield. As wafer sizes increase, the defect cluster phenomenon becomes more apparent. Cluster indices currently used to describe this phenomenon have major limitations. Causes of process variation can sometimes be identified by analyzing wafer defect patterns. However, human recognition of defect patterns can be time-consuming and inaccurate. This study presents a novel recognition system using multi-class support vector machines with a new defect cluster index to efficiently and accurately recognize wafer defect patterns. A simulated case demonstrates the effectiveness of the proposed model.