Manufacturing evaluation system based on AHP/ANP approach for wafer fabricating industry

Authors:
Chang-Lin Yang;Shan-Ping Chuang;Rong-Hwa Huang
Affiliations:
Department of Business Administration, Fu Jen Catholic University, No. 510, Chung-Cheng Road, Hsinchuang City, Taipei Hsien 24205, Taiwan, ROC;Department of Information Management, Huafan University, No. 1, Huafan Road, Shihding Township, Taipei County 22301, Taiwan, ROC;Graduate Institute of Management, Fu Jen Catholic University, No. 510, Chung-Cheng Road, Hsinchuang City, Taipei, Hsien 24205, Taiwan, ROC
Venue:
Expert Systems with Applications: An International Journal
Year:
2009

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Abstract

The critical role played by manufacturing performance measurement systems in achieving competitive success is increasingly recognized. Manufacturing success may depend on the compatibility between a performance measurement system in operation at subordinate organizational levels and an organization's global goals. Therefore, developing an integrated performance measurement model is significant for strategy management. This study proposes an integrated process that allows manufacturing systems to construct performance measurement model. Performance criteria from the literature and an expert questionnaire were utilized prior to building the performance measurement model. The analytical hierarchy process (AHP) and the analytical network process (ANP) are utilized to determine the weight of each criterion when generating the performance model for manufacturing systems.