An efficient reliability evaluation approach for system-level design of embedded systems

  • Authors:

  • Adeel Israr;Abdulhadi Shoufan;Sorin A. Huss

  • Affiliations:

  • Integrated Circuits and Systems Lab, Technische Universität Darmstadt, Germany;Integrated Circuits and Systems Lab, Technische Universität Darmstadt, Germany;Integrated Circuits and Systems Lab, Technische Universität Darmstadt, Germany

  • Venue:
  • ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
  • Year:
  • 2009

Quantified Score

Hi-index 0.00

Visualization

Abstract

A system-level design process of reliable systems demands efficient reliability evaluation of the explored design alternatives. This paper presents a new approach to accelerate the reliability evaluation and, thus, the design space exploration for reliable systems. A new data structure denoted as System Error Decision Diagram (SEDD) is proposed, which is based on both binary decision diagrams to model permanent errors and zero-suprressed decision diagrams to model transient errors. Both contructing the SEDD diagram and evaluating reliability based on it are detailed in an algorithmic way. The proposed approach is demonstrated for a control system taken from the automotive domain.