Parametric analysis to determine accurate interconnect extraction corners for design performance

Authors:
Ayhan Mutlu;Jiayong Le;Ruben Molina;Mustafa Celik
Affiliations:
Extreme DA Corporation, 3211 Scott Blvd., Santa Clara, CA 95054, USA;Extreme DA Corporation, 3211 Scott Blvd., Santa Clara, CA 95054, USA;Extreme DA Corporation, 3211 Scott Blvd., Santa Clara, CA 95054, USA;Extreme DA Corporation, 3211 Scott Blvd., Santa Clara, CA 95054, USA
Venue:
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
Year:
2009

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Cited 1

Statistical path selection for at-speed test

IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

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Abstract

In this paper we propose a technique to determine accurate interconnect extraction corners for a 65-nm design using parametric RC extraction and timing analysis. We calculate the sensitivity of a design metric such as hold slack to each interconnect variation parameter. These sensitivities are then sorted for a selected number of critical paths. Finally, we utilize this information to determine the parameters which lead to extraction corner cases in the design. The results has shown that parametric analysis is necessary for a better interconnect variation coverage in the design.