Structured Highlight Inspection of Specular Surfaces
IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence
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Shape recovery of specular surface is a challenging task; camera images of these surfaces are difficult to interpret because they are often characterized by highlights. Structured Highlight approach is a classic and effective way for specular inspection, this paper suggests a new strategy to recover dense normals of a specular surface and reconstruct its shape by combining the ideas of Structured Highlight, color source coding, highlight stripe and its translations. Point sources with different colors are positioned on orbits to illuminate a specular object surface. These point sources are scanned, and highlights on the object surface resulting from each point source are used to derive local surface orientation. Dense normal information can be recovered by translating these orbits. Some experimental system configurations are given. The simulation results show that the new method is feasible and can be used to reconstruct shape of specular surface in a high precision.