On-Chip Structures for Timing Measurements and Test
ASYNC '02 Proceedings of the 8th International Symposium on Asynchronus Circuits and Systems
CMOS Circuit Design, Layout, and Simulation, Second Edition
CMOS Circuit Design, Layout, and Simulation, Second Edition
CMOS Digital Integrated Circuits Analysis & Design
CMOS Digital Integrated Circuits Analysis & Design
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This paper presents a Synthesizable high-resolution time measurement and test scheme for digital System on Chip (SoC) application namely Two-Delay Interpolation Method (TDIM). The scheme is designed to measure internal timing parameters in SoC architecture such as jitter, set-up and hold time, delay faults and etc. Simulation result shows the circuit is capable to measure as low as 5 ps timing interval and the range of measurement is programmable using programmable logic core in SoC. The small size of the design makes it eminently suitable for SoC applications, particularly when the accurate measurement of small time intervals are required; a need which is increasing as operational speeds tend toward 100GHz.