Introduction to statistical pattern recognition (2nd ed.)
Introduction to statistical pattern recognition (2nd ed.)
Eigenfaces vs. Fisherfaces: Recognition Using Class Specific Linear Projection
IEEE Transactions on Pattern Analysis and Machine Intelligence
Statistical Pattern Recognition: A Review
IEEE Transactions on Pattern Analysis and Machine Intelligence
Pattern Classification (2nd Edition)
Pattern Classification (2nd Edition)
Discriminative Common Vectors for Face Recognition
IEEE Transactions on Pattern Analysis and Machine Intelligence
Learning Weighted Metrics to Minimize Nearest-Neighbor Classification Error
IEEE Transactions on Pattern Analysis and Machine Intelligence
Learning to combine distances for complex representations
Proceedings of the 24th international conference on Machine learning
Journal of Cognitive Neuroscience
Distance Learning for Similarity Estimation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Scaling Up a Metric Learning Algorithm for Image Recognition and Representation
ISVC '08 Proceedings of the 4th International Symposium on Advances in Visual Computing, Part II
Discriminative Common Vector Method With Kernels
IEEE Transactions on Neural Networks
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A recently proposed metric learning algorithm which enforces the optimal discrimination of the different classes is extended and empirically assessed using different kinds of publicly available data. The optimization problem is posed in terms of landmark points and then, a stochastic approach is followed in order to bypass some of the problems of the original algorithm. According to the results, both computational burden and generalization ability are improved while absolute performance results remain almost unchanged.