BISD: scan-based built-in self-diagnosis
Proceedings of the Conference on Design, Automation and Test in Europe
| Hi-index | 0.00 |
Programmable mixed-mode BIST schemes combine pseudo-random pattern testing and deterministic test. This paper presents a synthesis technique for a mixed-mode BIST scheme which is able to exploit the regularities of a deterministic test pattern set for minimizing the hardware overhead and memory requirements. The scheme saves more than 50% hardware costs compared with the best schemes known so far while complete programmability is still preserved.