Some aspects regarding pattern resistant logic

  • Authors:
  • Mirella Amelia Mioc

  • Affiliations:
  • Computer Science Department, "Politehnica" University of Timisoara, Romania

  • Venue:
  • ICCOMP'09 Proceedings of the WSEAES 13th international conference on Computers
  • Year:
  • 2009

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Abstract

Built-in self tests (BISTs) are the kernel of any modern reliability tests, be it weapons, avionics, medical devices or automotive electronics. However the strict time constraints limit the complexity of the tests as such, that multiple compression methods via a parallel LFSR signature analyzer exist [2].This paper's purpose is to raise awareness of the issue and proposes a common framework for the identification of pattern resistant logic as well as a means to ensure a more stable and safe fault tolerance using a ROM memory as a LUT(look-up table).