A 25-mV-sensitivity 2-Gb/s optimum-logic-threshold capacitive-coupling receiver for wireless wafer probing systems

  • Authors:

  • Gil-Su Kim;Makoto Takamiya;Takayasu Sakurai

  • Affiliations:

  • Institute of Industrial Science, University of Tokyo, Tokyo, Japan;Institute of Industrial Science, University of Tokyo, Tokyo, Japan;Institute of Industrial Science, University of Tokyo, Tokyo, Japan

  • Venue:
  • IEEE Transactions on Circuits and Systems II: Express Briefs
  • Year:
  • 2009

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Abstract

A high-sensitivity capacitive-coupling receiver is presented for wireless wafer probing systems. The receiver with the optimum logic threshold (OLT) achieves the highest sensitivity of 25 mV at the data rate of 2 Gb/s in 0.18-µm CMOS. The OLT receiver increases the communication distance by more than four times while providing tolerance against distance-voltage-area variations.