An Algorithm to Enumerate All Cutsets of a Graph in Linear Time per Cutset
Journal of the ACM (JACM)
ECOOP '01 Proceedings of the 15th European Conference on Object-Oriented Programming
On a multimode test sequencing problem
IEEE Transactions on Systems, Man, and Cybernetics, Part B: Cybernetics
Test Sequencing in Complex Manufacturing Systems
IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans
Risk-Based Stopping Criteria for Test Sequencing
IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans
Metasynthesis: M-space, M-interaction, and M-computing for open complex giant systems
IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans
IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans - Special issue on model-based diagnostics
Estimating and quantifying the impact of using models for integration and testing
Computers in Industry
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The integration and test phase of complex manufacturing machines, like an ASML lithographic manufacturing system, is expensive and time consuming. The tests that can be performed at a certain point in time during the integration phase depend on the modules that are integrated and, therefore, on the preceding integration sequence. In this paper, we introduce a mathematical model to describe an overall integration and test sequencing problem, and we propose an algorithm to solve this problem. The method is a combination of integration sequencing and test sequencing. Furthermore, we introduce several strategies that determine when test phases should start. With a case study within the development of a software release that is used to control an ASML lithographic machine, we show that the described method and strategies can be used to solve real-life problems.