Pervasive diagnosis

  • Authors:
  • Lukas Kuhn;Bob Price;Minh Do;Juan Liu;Rong Zhou;Tim Schmidt;Johan De Kleer

  • Affiliations:
  • Palo Alto Research Center, Palo Alto, CA;Palo Alto Research Center, Palo Alto, CA;Palo Alto Research Center, Palo Alto, CA;Palo Alto Research Center, Palo Alto, CA;Palo Alto Research Center, Palo Alto, CA;Palo Alto Research Center, Palo Alto, CA;Palo Alto Research Center, Palo Alto, CA

  • Venue:
  • IEEE Transactions on Systems, Man, and Cybernetics, Part A: Systems and Humans - Special issue on model-based diagnostics
  • Year:
  • 2010

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Abstract

In model-based production, a planner uses a system description to create plans that achieve production goals. The same description can be used by model-based diagnosis to infer the condition of components from sensor data. When production is realized by a sequence of plans, prior work has demonstrated that diagnosis can be used to adapt the plans to compensate for component degradation. However, the sources of diagnostic information are severely limited. Diagnosis must either make inferences from observations during production over which it has no control (passive diagnosis), or production must be halted to introduce diagnostic-specific plans (explicit diagnosis). We observe that the declarative nature of the model-based approach allows the planner to achieve production goals in multiple ways. This flexibility is exploited by a novel paradigm, i.e., pervasive (active) diagnosis, which constructs informative production plans that simultaneously achieve production goals while uncovering additional diagnostic information about the condition of components. We present an efficient heuristic search for these informative production plans and show through experiments on a model of an industrial digital printing press that the theoretical increase in long-run productivity can be realized on practical real-time systems. We obtain higher long-run productivity than a decoupled combination of planning and diagnosis.