Signals & systems (2nd ed.)
Distortion Analysis of Analog Integrated Circuits
Distortion Analysis of Analog Integrated Circuits
The Volterra and Wiener Theories of Nonlinear Systems
The Volterra and Wiener Theories of Nonlinear Systems
Behavioral modeling for calibration of pipeline analog-to-digital converters
IEEE Transactions on Circuits and Systems Part I: Regular Papers
An improved common-mode feedback loop for the differential-difference amplifier
Analog Integrated Circuits and Signal Processing
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A novel model predicts tracking nonlinearity (NL) in the form of harmonic distortion (HD) for weakly nonlinear (i.e., SFDA 30 dBc) first-order open-loop sampling circuits. The mechanisms for the NL are exponential settling, amplitude modulation, phase modulation, and discrete-time modulation. The model demonstrates that HD typically increases at 20 dB per decade over most standard operating ranges and is a function of input frequency, sampling bandwidth, input amplitude, sample rate, and component NL. The application of the model is reduced to the equivalent of frequency-independent NL analysis over this range, requiring only a Taylor series expansion of the NL time constant. Design insight is given for common MOS switch types, revealing a high correlation between HD and bandwidth. The first method to quantify the tradeoff between thermal noise (SNR) and linearity [spurious-free dynamic range (SFDR)] for sampling circuits is presented. Measured HD2, HD3, HD4, and HD5 versus frequency at multiple sample rates of a sample-and-hold test chip fabricated in a 0.25-µm 1P5M CMOS process and Spectre simulation results support the findings. The results broadly apply to switched-capacitor circuits in general and sampling circuits specifically, regardless of technology.