A new technique for characterization of digital-to-analog converters in high-speed systems
Proceedings of the conference on Design, automation and test in Europe
Design of a parallel low power flash A/D converter for the sub-sampling IR-UWB receiver
Analog Integrated Circuits and Signal Processing
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Time-interleaved analog-to-digital converters (TIADCs) are sensitive to various mismatches that distort the sampled signal. Standard TIADC analysis assumes a narrowband sinusoidal input, which may result in pessimistic matching constraints for system-specific ADCs used with wideband input signals. Closed-form expressions bounding the acceptable phase-skew for wideband systems are derived and are validated through simulations. In one of the examples presented, it is shown that standard analysis can overconstrain the bound on acceptable phase-skew variance by a factor of three.