A Benchmark Characterization of the EEMBC Benchmark Suite

  • Authors:
  • Jason A. Poovey;Thomas M. Conte;Markus Levy;Shay Gal-On

  • Affiliations:
  • Georgia Institute of Technology;Georgia Institute of Technology;EDN Embedded Microprocessor Benchmark Consortium;EDN Embedded Microprocessor Benchmark Consortium

  • Venue:
  • IEEE Micro
  • Year:
  • 2009

Quantified Score

Hi-index 0.00

Visualization

Abstract

Benchmark consumers expect benchmark suites to be complete, accurate, and consistent, and benchmark scores serve as relative measures of performance. However, it is important to understand how benchmarks stress the processors that they aim to test. This study explores the stress points of the EEMBC embedded benchmark suite using the benchmark characterization technique.