Robust affine-invariant similarity measures for patterned triangles

Authors:
Peter Revesz
Affiliations:
University of Nebraska-Lincoln, Lincoln, Nebraska and University of Athens Ilissia, Athens, Greece
Venue:
CGIM '08 Proceedings of the Tenth IASTED International Conference on Computer Graphics and Imaging
Year:
2008

Citing 4
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Abstract

A robust image similarity measure is presented for patterned triangles. A novel feature of the new similarity measure is the reduction of the patterns to a simple set of affine-invariant bar-codes.