Summary of the 2006 model size metrics workshop

  • Authors:

  • Frank Weil;Andrij Neczwid

  • Affiliations:

  • Motorola, Schaumburg, IL;Motorola, Schaumburg, IL

  • Venue:
  • MoDELS'06 Proceedings of the 2006 international conference on Models in software engineering
  • Year:
  • 2006

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Abstract

A standardized and consistent means of determining the size of an artifact is fundamental to the ability to collect metrics such as defect density and productivity about the artifact. For example, source lines of code is often used as the size metric for C code. However, the concept of lines of code does not readily apply to modeling languages such as UML and SDL. This report summarizes the presentations and discussions on this topic from the 2006 Model Size Metrics workshop.