Self-Checking Detection and Diagnosis of Transient, Delay, and Crosstalk Faults Affecting Bus Lines
IEEE Transactions on Computers
Electronics beyond nano-scale CMOS
Proceedings of the 43rd annual Design Automation Conference
Small embeddable NBTI sensors (SENS) for tracking on-chip performance decay
ISQED '09 Proceedings of the 2009 10th International Symposium on Quality of Electronic Design
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Performance degradation of integrated circuits due to aging effects, such as Negative Bias Temperature Instability (NBTI), is becoming of great concern for current and future CMOS technology. Here we introduce an aging sensor able to detect such degradations in the combinational part of a critical data-path. It requires lower area than recently proposed alternative solutions, and a lower or comparable power consumption.