Quantitatively managing defects for iterative projects: an industrial experience report in China

  • Authors:
  • Lang Gou;Qing Wang;Jun Yuan;Ye Yang;Mingshu Li;Nan Jiang

  • Affiliations:
  • Institute of Software, Chinese Academy of Sciences and Graduate University of Chinese Academy of Sciences;Institute of Software, Chinese Academy of Sciences;Beijing ZZNode Technologies Development Co., Ltd.;Institute of Software, Chinese Academy of Sciences;Institute of Software, Chinese Academy of Sciences;Institute of Software, Chinese Academy of Sciences and Graduate University of Chinese Academy of Sciences

  • Venue:
  • ICSP'08 Proceedings of the Software process, 2008 international conference on Making globally distributed software development a success story
  • Year:
  • 2008

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Abstract

Iterative development methodology has been widely adopted in recentyears since it is flexible and capable of dealing with requirement volatility.However, how to quantitatively manage iterative projects, and in particular,how to quantitatively manage defects across multiple iterations, remains a challengingissue. There is lack of quantitative defect management support for iterativeprojects due to the difficulty in selecting appropriate control points andmeasures to collect and analyze data, and determining the "sweet spot" amountof effort for performing testing and defect fixing activities. In this paper, wefirst propose the BiDefect (process-performance Baselines based iteration Defectmanagement) method to support quantitative defect management in iterativedevelopment. Then we report an industrial experience that a Chinese telecommunicationscompany, ZZNode, successfully applied the BiDefect methodin initial estimating, analyzing, re-estimating, and controlling defects for iterativedevelopment projects.