Symbolic test generation using a temporal logic with constrained events

Authors:
Daguang Liu;Peng Wu;Huimin Lin
Affiliations:
Lab of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing, China and Graduate School, Chinese Academy of Sciences, Beijing China;CNRS and LIX, Ecole Polytechnique, Palaiseau Cedex, France;Lab of Computer Science, Institute of Software, Chinese Academy of Sciences, Beijing, China
Venue:
Formal methods and hybrid real-time systems
Year:
2007

Citing 4
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Abstract

A temporal logic with constrained event modallities, TLCE, is proposed to represent test purposes for testing concurrent programs. The logic is capable can express not only temporal relationships among input and output events, but also data dependencies between event parameters. A TLCE-based test generation algorithm is developed to automatically derive symbolic test cases that incorporate given data dependency constraints as verdict conditions. The advantage of the approach is demonstrated with a case study on a cache coherence protocol.