Formal lifetime reliability analysis using continuous random variables
WoLLIC'10 Proceedings of the 17th international conference on Logic, language, information and computation
Towards robustness analysis using PVS
ITP'11 Proceedings of the Second international conference on Interactive theorem proving
Formal analysis of a scheduling algorithm for wireless sensor networks
ICFEM'11 Proceedings of the 13th international conference on Formal methods and software engineering
Formal probabilistic analysis: a higher-order logic based approach
ABZ'10 Proceedings of the Second international conference on Abstract State Machines, Alloy, B and Z
Formal probabilistic analysis of cyber-physical transportation systems
ICCSA'12 Proceedings of the 12th international conference on Computational Science and Its Applications - Volume Part III
Formalization of Measure Theory and Lebesgue Integration for Probabilistic Analysis in HOL
ACM Transactions on Embedded Computing Systems (TECS) - Special Issue on Modeling and Verification of Discrete Event Systems
An approach for lifetime reliability analysis using theorem proving
Journal of Computer and System Sciences
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Reliability analysis has become a tool of fundamental importance to virtually all electrical and computer engineers because of the extensive usage of hardware systems in safety and mission critical domains, such as medicine, military, and transportation. Due to the strong relationship between reliability theory and probabilistic notions, computer simulation techniques have been traditionally used to perform reliability analysis. However, simulation provides less accurate results and cannot handle large-scale systems due to its enormous CPU time requirements. To ensure accurate and complete reliability analysis and thus more reliable hardware designs, we propose to conduct a formal reliability analysis of systems within the sound core of a higher order logic theorem prover (HOL). In this paper, we present the higher order logic formalization of some fundamental reliability theory concepts, which can be built upon to precisely analyze the reliability of various engineering systems. The proposed approach and formalization is then utilized to analyze the repairability conditions for a reconfigurable memory array in the presence of stuck-at and coupling faults.