Optimal string edit distance based test suite reduction for SDL specifications

Authors:
Gábor Kovács;Gábor Árpád Németh;Mahadevan Subramaniam;Zoltán Pap
Affiliations:
Department of Telecommunications and Media Informatics, ETIK, Budapest University of Technology and Economics, Budapest, Hungary;Department of Telecommunications and Media Informatics, ETIK, Budapest University of Technology and Economics, Budapest, Hungary;Computer Science Department, University of Nebraska at Omaha, Omaha, NE;Ericsson Telecomm. Hungary, Budapest, Hungary
Venue:
SDL'09 Proceedings of the 14th international SDL conference on Design for motes and mobiles
Year:
2009

Citing 10
Cited 1

A methodology for controlling the size of a test suite

ACM Transactions on Software Engineering and Methodology (TOSEM)
The k-cardinality assignment problem

GO-II Meeting Proceedings of the second international colloquium on Graphs and optimization
The String-to-String Correction Problem

Journal of the ACM (JACM)
Introduction to algorithms

Introduction to algorithms
On Test Coverage Metrics for Communication Protocols

Proceedings of the IFIP TC6/WG6.1 Fourth International Workshop on Protocol Test Systems IV
Formal Test Automation: The Conference Protocol with PHACT

TestCom '00 Proceedings of the IFIP TC6/WG6.1 13th International Conference on Testing Communicating Systems: Tools and Techniques
Formulation of the Interaction Test Coverage Problem as an Integer Program

TestCom '02 Proceedings of the IFIP 14th International Conference on Testing Communicating Systems XIV
Test Selection, Trace Distance and Heuristics

TestCom '02 Proceedings of the IFIP 14th International Conference on Testing Communicating Systems XIV
An EFSM-based test generation for validation of SDL specifications

Proceedings of the 3rd international workshop on Automation of software test
Applying mutation analysis to SDL specifications

SDL'03 Proceedings of the 11th international conference on System design

Prioritizing test cases with string distances

Automated Software Engineering

Quantified Score

Hi-index	0.00

Visualization

Abstract

We propose a test selection method that provides efficient test sets for systems based on SDL specifications. Our approach builds on previous results of Voung et al. and Feijs et al. on string edit distance based coverage metrics. The method reduces a set of test cases represented in the MSC (Message Sequence Chart) notation, while maintaining the highest possible distance between all pairs of traces defined by the given test set. The algorithm is tunable by a parameter representing the threshold distance for test redundancy. We show that the algorithm runs in polynomial time of the size of the input test set and that it is independent of the size of the system. We implemented and incorporated the algorithm into our SDL-based test selection framework, and evaluated against existing symbol coverage and fault coverage based test selection approaches by conducting experiments on the well-known INRES and Conference Protocol. Results indicate that the string edit distance based method yields similar results in terms of reduction-capability and coverage as the other approaches, but with significantly less complexity.