Bayesian blind deconvolution from differently exposed image pairs

  • Authors:
  • S. Derin Babacan;Jingnan Wang;Rafael Molina;Aggelos K. Katsaggelos

  • Affiliations:
  • EECS Department, Northwestern University, Evanston, IL;EECS Department, Northwestern University, Evanston, IL;Departamento de Ciencias de la Computación e I.A., Universidad de Granada, Granada, Spain;EECS Department, Northwestern University, Evanston, IL

  • Venue:
  • ICIP'09 Proceedings of the 16th IEEE international conference on Image processing
  • Year:
  • 2009

Quantified Score

Hi-index 0.01

Visualization

Abstract

Photographs acquired under low-light conditions require long exposure times and therefore exhibit significant blurring due to the shaking of the camera. Using shorter exposure times results in sharper images but with a very high level of noise. In this paper we address this problem and present a novel blind deconvolution algorithm for a pair of differently exposed images. We formulate the problem in a hierarchical Bayesian framework by utilizing prior knowledge on the unknown image and blur, and also on the dependency between two observed images. By incorporating a fully Bayesian analysis, the developed algorithm estimates all necessary algorithm parameters along with the unknowns, such that no user-intervention is needed. Moreover, we employ a variational Bayesian inference procedure, which allows for the statistical compensation of errors occurring at different stages of the restoration, and also provides uncertainties of the estimates. Experimental results demonstrate the high restoration performance of the proposed algorithm.