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Out-of-core tensor approximation of multi-dimensional matrices of visual data
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ICCV '05 Proceedings of the Tenth IEEE International Conference on Computer Vision - Volume 2
IEEE Transactions on Pattern Analysis and Machine Intelligence
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IEEE Transactions on Pattern Analysis and Machine Intelligence
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Texture classification using Gabor wavelets based rotation invariant features
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IEEE Transactions on Pattern Analysis and Machine Intelligence
Spectral Regression: A Unified Approach for Sparse Subspace Learning
ICDM '07 Proceedings of the 2007 Seventh IEEE International Conference on Data Mining
Efficient Kernel Discriminant Analysis via Spectral Regression
ICDM '07 Proceedings of the 2007 Seventh IEEE International Conference on Data Mining
Robust Face Recognition via Sparse Representation
IEEE Transactions on Pattern Analysis and Machine Intelligence
Tensor linear Laplacian discrimination (TLLD) for feature extraction
Pattern Recognition
Lorentzian discriminant projection and its applications
ACCV'09 Proceedings of the 9th Asian conference on Computer Vision - Volume Part III
An introduction to kernel-based learning algorithms
IEEE Transactions on Neural Networks
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We develop a supervised dimensionality reduction method, called Lorentzian discriminant projection (LDP), for feature extraction and classification. Our method represents the structures of sample data by a manifold, which is furnished with a Lorentzian metric tensor. Different from classic discriminant analysis techniques, LDP uses distances from points to their within-class neighbors and global geometric centroid to model a new manifold to detect the intrinsic local and global geometric structures of data set. In this way, both the geometry of a group of classes and global data structures can be learnt from the Lorentzian metric tensor. Thus discriminant analysis in the original sample space reduces to metric learning on a Lorentzian manifold. We also establish the kernel, tensor and regularization extensions of LDP in this paper. The experimental results on benchmark databases demonstrate the effectiveness of our proposed method and the corresponding extensions.