A process-tolerant cache architecture for improved yield in nanoscale technologies
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Variability in sub-100nm SRAM designs
Proceedings of the 2004 IEEE/ACM International conference on Computer-aided design
Yield-Aware Cache Architectures
Proceedings of the 39th Annual IEEE/ACM International Symposium on Microarchitecture
Trading off Cache Capacity for Reliability to Enable Low Voltage Operation
ISCA '08 Proceedings of the 35th Annual International Symposium on Computer Architecture
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This paper presents a novel cache architecture using 7T/14T hybrid SRAM, which can dynamically improve its reliability with control lines. Our proposed 14T word-enhancing scheme can enhance its operating margin in word granularity by combining two words in a low-voltage mode. The proposed scheme is suitable for dynamic voltage and frequency scaling (DVFS). In a 65-nm process, it can reduce the minimum operation voltage (Vmin) to 0.5 V, which is 42% and 21% lower, respectively, than the conventional 6T SRAM and the cache word-disable scheme. The respective power reductions are 90% and 65%.