Delay fault testing: trading fault coverage, test set size, and performance

• Authors:

• William K. Lam;Alexander Saldanha;Robert K. Brayton;Alberto L. Sangiovanni-Vincentelli

• Affiliations:

• -;-;-;-

• Venue:
• Proceedings of the 1993 symposium on Research on integrated systems
• Year:
• 1993