Bond graph based Bayesian network for fault diagnosis

  • Authors:
  • C. H. Lo;Y. K. Wong;A. B. Rad

  • Affiliations:
  • Division of Science, Technology, HKCC, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, China;Department of Electrical Engineering, The Hong Kong Polytechnic University, Hung Hom, Kowloon, Hong Kong, China;School of Engineering Science, Simon Fraser University, 250-23450, 102nd Avenue, Surrey, BC V3T 0A3, Canada

  • Venue:
  • Applied Soft Computing
  • Year:
  • 2011

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Abstract

Model-based fault diagnosis using artificial intelligence techniques often deals with uncertain knowledge and incomplete information. Probability reasoning is a method to deal with uncertain or incomplete information, and Bayesian network is a tool that brings it into the real world application. A novel approach for constructing the Bayesian network structure on the basis of a bond graph model is proposed. Specification of prior and conditional probability distributions (CPDs) for the Bayesian network can be completed by expert knowledge and learning from historical data. The resulting Bayesian network is then applied for diagnosing faulty components from physical systems. The performance of the proposed fault diagnosis scheme based on bond graph derived Bayesian network is demonstrated through simulation studies.