Timed test generation based on timed temporal logic

Authors:
Stefan D. Bruda;Chun Dai
Affiliations:
Department of Computer Science, Bishop's University, Quebec, Canada;Department of Computer Science, Bishop's University, Quebec, Canada
Venue:
ICAI'10 Proceedings of the 11th WSEAS international conference on Automation & information
Year:
2010

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Abstract

Based on a previously developed testing theory for real-time systems, we show how timed tests can be algorithmically generated out of a timed variant of linear-time temporal logic (namely, TPTL), so that a process must pass the generated test if and only if the process satisfies the given temporal logic formula. Beside the obvious use of such an algorithm (to generate tests), our result also establishes a correspondence between timed must testing and timed temporal logic.