Stochastic chase decoding of reed-Solomon codes

Authors:
Camille Leroux;Saied Hemati;Shie Mannor;Warren J. Gross
Affiliations:
Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada;Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada;Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada;Department of Electrical and Computer Engineering, McGill University, Montreal, QC, Canada
Venue:
IEEE Communications Letters
Year:
2010

Citing 3
Cited 0

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Abstract

In this letter, we propose a probabilistic approach to the generation of test patterns in the Chase Algorithm (CA) denoted as the Stochastic Chase Algorithm (SCA). We compare the performance of SCA with the regular CA for different Reed-Solomon codes. Simulation results show that the probabilistic nature of the SCA helps in providing a more efficient test pattern generation. SCA avoids the use of least reliable bits selection and reduces the number of candidate codewords up to 60% for the same decoding performance.