Protocol specifications and component adaptors
ACM Transactions on Programming Languages and Systems (TOPLAS)
Journal of Systems and Software
Multilevel Testing for Design Verification of Embedded Systems
IEEE Design & Test
Building Reusable Test Assets for a Product Line
ICSR-7 Proceedings of the 7th International Conference on Software Reuse: Methods, Techniques, and Tools
From Requirements to Validated Embedded Systems
EMSOFT '01 Proceedings of the First International Workshop on Embedded Software
Model-centric software architecture reconstruction
Software—Practice & Experience
Challenges in automotive software engineering
Proceedings of the 28th international conference on Software engineering
Continuous TTCN-3: testing of embedded control systems
Proceedings of the 2006 international workshop on Software engineering for automotive systems
From Requirements to Statistical Testing of Embedded Systems
SEAS '07 Proceedings of the 4th International Workshop on Software Engineering for Automotive Systems
Mulit-level system integration based on AUTOSAR
Proceedings of the 30th international conference on Software engineering
Modeling Property Based Stream Templates with TTCN-3
TestCom '08 / FATES '08 Proceedings of the 20th IFIP TC 6/WG 6.1 international conference on Testing of Software and Communicating Systems: 8th International Workshop
Reusing Component Test Cases for Integration Testing of Retarding Embedded System Components
VALID '09 Proceedings of the 2009 First International Conference on Advances in System Testing and Validation Lifecycle
Integrating Component Tests to System Tests
Electronic Notes in Theoretical Computer Science (ENTCS)
Integrating Test Levels for Embedded Systems
TAIC-PART '09 Proceedings of the 2009 Testing: Academic and Industrial Conference - Practice and Research Techniques
A framework for hardware-in-the-loop testing of an integrated architecture
SEUS'07 Proceedings of the 5th IFIP WG 10.2 international conference on Software technologies for embedded and ubiquitous systems
Top-Down Reuse for Multi-level Testing
ECBS '10 Proceedings of the 2010 17th IEEE International Conference and Workshops on the Engineering of Computer-Based Systems
FATES'04 Proceedings of the 4th international conference on Formal Approaches to Software Testing
Test strategies in distributed software development environments
Computers in Industry
| Hi-index | 0.00 |
Lifecycle models divide the test process into consecutive test levels that are considered independently. This strict separation obstructs the view on the test process as a whole and fails to reflect the commonalities across test levels. Multi-level testing is an emerging approach that addresses the challenge of integrating test levels, putting particular emphasis on embedded systems. In this paper, we introduce a test level integration strategy based on reuse that is called bottom-up reuse. In addition, we present a test level instrument that seamlessly supports this strategy: multi-level test cases. We also provide a case study that reflects the positive results we have obtained in practice so far and demonstrates the feasibility of our test level integration approach. Bottom-up reuse and multi-level test cases lead to testing earlier on in the development process while reducing the effort required by test specification, test design, and test implementation.