Improving the testing and testability of software product lines

  • Authors:
  • Isis Cabral;Myra B. Cohen;Gregg Rothermel

  • Affiliations:
  • Department of Computer Science, University of Nebraska-Lincoln;Department of Computer Science, University of Nebraska-Lincoln;Department of Computer Science, University of Nebraska-Lincoln

  • Venue:
  • SPLC'10 Proceedings of the 14th international conference on Software product lines: going beyond
  • Year:
  • 2010

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Abstract

Software Product Line (SPL) engineering offers several advantages in the development of families of software products. There is still a need, however, for better understanding of testability issues and for testing techniques that can operate cost-effectively on SPLs. In this paper we consider these testability issues and highlight some differences between optional versus alternative features. We then provide a graph based testing approach called the FIG Basis Path method that selects products and features for testing based on a feature dependency graph. We conduct a case study on several non-trivial SPLs and show that for these subjects, the FIG Basis Path method is as effective as testing all products, but tests no more than 24% of the products in the SPL.