Alloy: a lightweight object modelling notation
ACM Transactions on Software Engineering and Methodology (TOSEM)
Feature-Oriented Project Line Engineering
IEEE Software
A Standard Problem for Evaluating Product-Line Methodologies
GCSE '01 Proceedings of the Third International Conference on Generative and Component-Based Software Engineering
Concepts and Guidelines of Feature Modeling for Product Line Software Engineering
ICSR-7 Proceedings of the 7th International Conference on Software Reuse: Methods, Techniques, and Tools
An Empirical Analysis of Equivalence Partitioning, Boundary Value Analysis and Random Testing
METRICS '97 Proceedings of the 4th International Symposium on Software Metrics
Testing Software Components Using Boundary Value Analysis
EUROMICRO '03 Proceedings of the 29th Conference on EUROMICRO
Coverage Criteria for Logical Expressions
ISSRE '03 Proceedings of the 14th International Symposium on Software Reliability Engineering
TestEra: Specification-Based Testing of Java Programs Using SAT
Automated Software Engineering
Software Product Line Engineering: Foundations, Principles and Techniques
Software Product Line Engineering: Foundations, Principles and Techniques
Coverage and adequacy in software product line testing
Proceedings of the ISSTA 2006 workshop on Role of software architecture for testing and analysis
SPLC '06 Proceedings of the 10th International on Software Product Line Conference
Automated analysis of feature models: challenges ahead
Communications of the ACM - Software product line
A specification-based approach to testing software product lines
Proceedings of the the 6th joint meeting of the European software engineering conference and the ACM SIGSOFT symposium on The foundations of software engineering
Introduction to Software Testing
Introduction to Software Testing
S.P.L.O.T.: software product lines online tools
Proceedings of the 24th ACM SIGPLAN conference companion on Object oriented programming systems languages and applications
Handbook of Weighted Automata
Automated and Scalable T-wise Test Case Generation Strategies for Software Product Lines
ICST '10 Proceedings of the 2010 Third International Conference on Software Testing, Verification and Validation
Incremental Test Generation for Software Product Lines
IEEE Transactions on Software Engineering
Software product line testing - A systematic mapping study
Information and Software Technology
Improving the testing and testability of software product lines
SPLC'10 Proceedings of the 14th international conference on Software product lines: going beyond
A systematic mapping study of software product lines testing
Information and Software Technology
Reducing combinatorics in testing product lines
Proceedings of the tenth international conference on Aspect-oriented software development
Assessing the maintainability of software product line feature models using structural metrics
Software Quality Control
The Art of Software Testing
Decision support for the software product line domain engineering lifecycle
Automated Software Engineering
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Product lines are often employed for the facilitation of software re-use, rapid application development and increase in productivity. Despite the numerous advantages of software product lines, the task of testing them is a cumbersome process due to the fact that the number of applications that need to be tested is exponential to the number of features represented in the product line. In this paper, we attempt to reduce the number of required tests for testing a software product line while at the same time preserving an acceptable fault coverage. For this purpose, we introduce eight coverage criteria based on the transformation of software product line feature models into formal context-free grammars. The theoretical foundation for the proposed coverage criteria is based on the development of equivalence partitions on the software product line configuration space and the use of boundary value analysis for test suite generation. We have performed experiments on several SPLOT feature models, the results of which show that the test suite generation strategies based on the proposed coverage criteria are effective in significantly reducing the number of required tests and at the same time maintaining a high fault coverage ratio.