Automated analysis of feature models: challenges ahead

  • Authors:
  • Don Batory;David Benavides;Antonio Ruiz-Cortes

  • Affiliations:
  • University of Texas at Austin;University of Seville, Spain;University of Seville, Spain

  • Venue:
  • Communications of the ACM - Software product line
  • Year:
  • 2006

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Abstract