Digital calibration of nonlinear memory errors in sigma-delta modulators

  • Authors:

  • Seung-Chul Lee;Yun Chiu

  • Affiliations:

  • Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL;Department of Electrical and Computer Engineering, University of Illinois at Urbana-Champaign, Urbana, IL

  • Venue:
  • IEEE Transactions on Circuits and Systems Part I: Regular Papers - Special section on 2009 IEEE custom integrated circuits conference
  • Year:
  • 2010

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Abstract

A digital adaptive calibration technique to linearize sigma-delta (ΣΔ) modulators based on an output-referred distortion analysis of discrete-time integrators (DTIs) is presented. A sequential power series (a special form of Volterra series) is found sufficient to model the nonlinear memory errors in a DTI, which entails the application of adaptive polynomial transversal filtering for error correction of the modulator. Error-parameter identification is accomplished by correlating various moments of the digital output with a 1-bit pseudorandom noise, which is injected into the analog input of each DTI of the modulator. Simulations demonstrate the effectiveness of the technique in compensating the signaldependent errors of first- and second-order ΣΔ modulators.