GRASP—a new search algorithm for satisfiability
Proceedings of the 1996 IEEE/ACM international conference on Computer-aided design
POPL '80 Proceedings of the 7th ACM SIGPLAN-SIGACT symposium on Principles of programming languages
Boundary Points and Resolution
SAT '09 Proceedings of the 12th International Conference on Theory and Applications of Satisfiability Testing
Automatic testing from formal specifications
TAP'07 Proceedings of the 1st international conference on Tests and proofs
Generating unit tests from formal proofs
TAP'07 Proceedings of the 1st international conference on Tests and proofs
On bridging simulation and formal verification
VMCAI'08 Proceedings of the 9th international conference on Verification, model checking, and abstract interpretation
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We consider the problem of test generation for Boolean combinational circuits. We use a novel approach based on the idea of treating tests as a proof encoding rather than as a sample of the search space. In our approach, a set of tests is complete for a circuit N, and a property p, if it "encodes" a formal proof that N satisfies p. For a combinational circuit of k inputs, the cardinality of such a complete set of tests may be exponentially smaller than 2k. In particular, if there is a short resolution proof, then a small complete set of tests also exists. We show how to use the idea of treating tests as a proof encoding to directly generate high-quality tests. We do this by generating tests that encode mandatory fragments of any resolution proof. Preliminary experimental results show the promise of our approach.