Accurate capture models and their impact on random access in multiple-destination networks

Authors:
Gam D. Nguyen;Jeffrey E. Wieselthier;Anthony Ephremides
Affiliations:
Naval Research Laboratory, Washington, DC;Naval Research Laboratory, Washington, DC;Electrical and Computer Eng. Dept. and Institute for Systems Research, University of Maryland, College Park, MD
Venue:
MILCOM'06 Proceedings of the 2006 IEEE conference on Military communications
Year:
2006

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Abstract

We extend existing models to better characterize the impact of the physical layer on random-access performance, and we highlight some ambiguities and inaccuracies that have been prevalent in the literature since physical models for capture were first studied. Most earlier studies of capture in random-access systems are applicable only to narrowband systems, although this limitation is often not noted. We present an analytical model that is applicable to wideband systems as well. Simulation is used to evaluate performance because of the high complexity of the analytical model. We present performance results for both single-destination and multiple-destination networks.