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Traditional cluster monitoring approaches consider nodes in singleton, using manufacturer-specified extreme limits as thresholds for failure "prediction". We have developed a tool, OVIS, for monitoring and analysis of large computational platforms which, instead, uses a statistical approach to characterize single device behaviors from those of a large number of statistically similar devices. Baseline capabilities of OVIS include the visual display of deterministic information about state variables ( e.g., temperature, CPU utilization, fan speed) and their aggregate statistics. Visual consideration of the cluster as a comparative ensemble, rather than as singleton nodes, is an easy and useful method for tuning cluster configuration and determining effects of realtime changes. Additionally, OVIS incorporates a novel Bayesian inference scheme to dynamically infer models for the normal behavior of a system and to determine bounds on the probability of values evinced in the system. Individual node values that are unlikely given the current applicable model are flagged as aberrant. This can be a much earlier indicator of problems than waiting for the crossing of some threshold that is necessarily set high to preclude too many false alarms. We present OVIS and discuss its applications in cluster configuration and environmental tuning and to abnormality and problem discovery in our production clusters.