Free-form polarized spherical illumination reflectometry

Authors:
Kaori Kikuchi;Bruce Lamond;Abhijeet Ghosh;Pieter Peers;Paul Debevec
Affiliations:
University of Southern California and Ritsumeikan University;University of Southern California;University of Southern California;University of Southern California and The College of William & Mary;University of Southern California
Venue:
ACM SIGGRAPH ASIA 2010 Sketches
Year:
2010

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Abstract

We present a prototype system for in-situ measurement of per-pixel appearance parameters (i.e., surface orientation, diffuse albedo, specular albedo, and specular roughness) of general scenes. The proposed system requires no specialized hardware, is light weight, and requires no on-site calibration. This makes our system particularly well suited for capturing the appearance of real-world scenes under uncontrolled conditions.