Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults

Authors:
Teruhiko Yamada;Takashi Nanya
Affiliations:
C&CSystems Research Laboratories, NEC Corporation, Kawasaki, 213, Japan.;C&CSystems Research Laboratories, NEC Corporation, Kawasaki, 213, Japan./ Department of Computer Science, Tokyo Institute of Technology, Tokyo, 152, Japan.
Venue:
IEEE Transactions on Computers
Year:
1984

Citing 5
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Abstract

Undetectable bridging faults between two arbitrary leads, which may produce feedback loops, in a unate two-level irredundant AND-OR network are anlyzed and their effect on stuck-at fault detection tests is explored. As a result, any complete test set for single stuck-at faults proves to still remain valid in the presence of undetectable bridging faults.