Enhancing Testability of Large-Scale Integrated Circuits via Test Points and Additional Logic
IEEE Transactions on Computers
Optimal Detection of Bridge Faults and Stuck-At Faults in Two-Level Logic
IEEE Transactions on Computers
Analyzing Errors with the Boolean Difference
IEEE Transactions on Computers
IEEE Transactions on Computers
Diagnosis of Short-Circuit Faults in Combinational Circuits
IEEE Transactions on Computers
On the Properties of Irredundant Logic Networks
IEEE Transactions on Computers
On the Design of Logic Networks with Redundancy and Testability Considerations
IEEE Transactions on Computers
On the Impossible Class of Faulty Functions in Logic Networks Under Short Circuit Faults
IEEE Transactions on Computers
Detection and Location of Input and Feedback Bridging Faults Among Input and Output Lines
IEEE Transactions on Computers
Universal Tests for Detection of Input/Output Stuck-At and Bridging Faults
IEEE Transactions on Computers
Stuck-At Fault Tests in the Presence of Undetectable Bridging Faults
IEEE Transactions on Computers
ITC'84 Proceedings of the 1984 international test conference on The three faces of test: design, characterization, production
Automatic test pattern generation
SFM'06 Proceedings of the 6th international conference on Formal Methods for the Design of Computer, Communication, and Software Systems
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The study of bridging faults (or short circuits that occur between conducting paths) has become increasingly important with the advent of LSI technology. To date, only a very few papers have been published on this topic. Specifically, little is known regarding undetectable bridging faults. More importantly, what has yet to be explored are the effects of undetectable bridging faults on the tests designed to detect stuck-at faults.