Undetectability of Bridging Faults and Validity of Stuck-At Fault Test Sets
IEEE Transactions on Computers
Optimal Detection of Bridge Faults and Stuck-At Faults in Two-Level Logic
IEEE Transactions on Computers
Syndrome-Testable Design of Combinational Circuits
IEEE Transactions on Computers
Detection and Location of Input and Feedback Bridging Faults Among Input and Output Lines
IEEE Transactions on Computers
Physical Versus Logical Fault Models MOS LSI Circuits: Impact on Their Testability
IEEE Transactions on Computers
Transition Count Testing of Combinational Logic Circuits
IEEE Transactions on Computers
IEEE Transactions on Computers
Diagnosis of Short-Circuit Faults in Combinational Circuits
IEEE Transactions on Computers
On Closedness and Test Complexity of Logic Circuits
IEEE Transactions on Computers
On Realizations of Boolean Functions Requiring a Minimal or Near-Minimal Number of Tests
IEEE Transactions on Computers
| Hi-index | 14.98 |
The important problem of recognizing a priori the class of Boolean functions which are never obtainable from a given combinational network under short circuit faults is almost unexplored, primarily due to lack of understanding of the functional and structural factors that influence the fault behavior in the network. In view of this, a new concept of impossible class of faulty functions (ICFF) is introduced in this correspondence. Several intriguing properties of ICFF are uncovered, namely, the undetectability of input bridging faults, the impossibility of the transformation of a fault free function Fo to a subset or superset of Fo, and to other functions belonging to the same P-and N-equivalence classes of Fo, etc. The closure amongst the fan-out-free and unate functions under bridging faults is investigated. The impact of ICFF on the testability of the network is also discussed.